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Electronics Test

Devices whose quality of operation is based on the effects of electrons.


Showing results: 646 - 660 of 784 items found.

  • Spectral Response SystemsQuantum Efficiency SystemsIPCE Measurement Systems

    Photo Emission Tech., Inc.

    QE system provides electronics and software designed for fully automated measurement of external quantum efficiency of solar cells. All systems include probes and a fixed plate sample stage for samples up to 150 mm x 150 mm. The main system components include: custom designed software, measurement electronics, and computer system (Windows 8 operating system). The measurement involves focusing monochromatic light to a spot on the device under test, then accurately measuring the photon flux and current from the test cell. The system utilizes a dual beam configuration with lock-in detection, providing an absolute accuracy of ±3%. The QE system uses a grating monochrometer with silicon/InGaAs/Ge detectors. The system includes automatic order sorting filters and two light sources for monochromatic illumination (a Xenon- arc lamp and a halogen lamp). A single lock-in amplifier is used to measure both the reference detector and test device. The main system comes with all the hardware needed to measure quantum efficiency, a fixed plate sample stage and probes.

  • Compact Semiconductor Tester

    QST4416-FC - Qmax Test Technologies Pvt. Ltd.

    The Qmax Model QST4416-FC is a compact small foot print, sophisticated automatic semiconductor tester. Its state-of-the-art hardware design which is freely configurable to user's application requirements and software features facilitates it to test linear & mixed signal IC components which covers a wide range of products like linear, Power management, Opto electronics, digital and mixed signal devices etc.

  • Logic Analyzer

    GoLogicXL-36 - NCI Logic Analyzers

    Logic analyzers and oscilloscopes offering fast sample rates and large memory depths are required to debug and test modern electronics. The GoLogicXL captures a very large window of bus activity using sample depths up to 1 billion samples. 4 GHz sampling rates expose the finest details in your signals. 1 GHz Transitional sampling provides the optimum method to capture fast data bursts separated by seconds, minutes, or even hours of bus inactivity. The GoLogicXL State analysis can also synchronize with single-data-rate 300 MHz SDR clocks, and double-date-rate 250 MHz DDR clocks (500 MHz effective).

  • Logic Analyzer

    GoLogicXL-72 - NCI Logic Analyzers

    Logic analyzers and oscilloscopes offering fast sample rates and large memory depths are required to debug and test modern electronics. The GoLogicXL captures a very large window of bus activity using sample depths up to 1 billion samples. 4 GHz sampling rates expose the finest details in your signals. 1 GHz Transitional sampling provides the optimum method to capture fast data bursts separated by seconds, minutes, or even hours of bus inactivity. The GoLogicXL State analysis can also synchronize with single-data-rate 300 MHz SDR clocks, and double-date-rate 250 MHz DDR clocks (500 MHz effective).

  • Temperature Forcing System

    ETF-SERIES - Envisys Technologies

    Precise Temperature Accuracies with Reliable Test Results Temperature Limits: -40/-60 °C to 30 °C Temperature Accuracies: ±2-3°C Temperature Rate of Change: 20-25 deg /min (Non-linear) Maintenance Free Access to The System Self-Sufficient System Compact with small footprints suitable for any space constraint laboratories Low decibel system Suitable for testing electronic chips / devices Environmentally friendly refrigerants Efficient heating Microprocessor based single set point PID temperature controller with data logging Flexible hose up to 2.5-3.0m Interchangeable heads according to chip size. Inbuilt electrical control panel with switchgear system

  • Penetrometers

    PCE Instruments

    Penetrometers measure the firmness or hardness of fruit. Penetrometers are ideal for determining the best time to harvest fruit or to test its progress to maturity. The firmness of fruit is one of the most widely used parameters in testing its maturity, together with measuring the fruits sugar content using refractometers. Electronic penetrometers come with different diameter penetration points. This allows for fruit of different size and hardness to be tested. It is important that this first part of the measurement process is done correctly if the readings obtained are to be valid in making adequate decisions as to when the fruit should be harvested. It is important the the samples that are measured are representative of the entire crop, considering a sufficient minimum quantity sample, size and quality.

  • Load Cells

    WIKA Alexander Wiegand SE & Co. KG

    Load cells are designed as a special form of force transducer for use in weighing equipment. These force transducers enable very high measurement accuracies of 0.01 % and 0.05 % of FS. Load cells are used in the widest variety of application areas, including platform, filling, belt and packaging scales, dynamic test systems as well as electronic precision, price-labelling and industrial scales. WIKA provides you with all typical and widely used load cell geometries such as single point load cells, bending and shear beam load cells, s-type load cells, canister load cells and compression force load cells. In addition, there are corresponding mounting kits and complete weighing modules available.

  • PXIe-2512, 7-Channel, 10 A PXI Signal Insertion Switch Module

    780587-12 - NI

    PXIe, 7-Channel, 10 A PXI Signal Insertion Switch Module—The PXIe‑2512 fault insertion unit (FIU) is designed for hardware‑in‑the‑loop (HIL) applications and electronic reliability tests. Each module has a set of feedthrough channels that you can open or short to one or more fault buses. You can use this architecture to simulate open or interrupted connections as well as shorts between pins, shorts to battery voltages, and shorts to ground on a per-channel basis. When controlled with the LabVIEW Real-Time Module, the PXIe‑2512 is ideal for validating the integrity of control systems including engine control units (ECUs) and full authority digital engine controls (FADECs).

  • PXIe-2514, 7-Channel, 40 A PXI Signal Insertion Switch Module

    780587-14 - NI

    PXIe, 7-Channel, 40 A PXI Signal Insertion Switch Module—The PXIe‑2514 fault insertion unit (FIU) is designed for hardware‑in‑the‑loop (HIL) applications and electronic reliability tests. Each module has a set of feedthrough channels that you can open or short to one or more fault buses. You can use this architecture to simulate open or interrupted connections as well as shorts between pins, shorts to battery voltages, and shorts to ground on a per-channel basis. When controlled with the LabVIEW Real-Time Module, the PXIe‑2514 is ideal for validating the integrity of control systems including engine control units (ECUs) and full authority digital engine controls (FADECs).

  • Oscilloscopes

    Scientech Technologies Pvt. Ltd.

    Oscilloscopes are essential tools for anyone designing, manufacturing or repairing electronics equipments. In today''s fast paced world, engineers need the best tools available to solve their measurement challenges quickly and accurately. Scientech Oscilloscopes are the key to meet today''s engineer measurement challenges. Today, Scientech Technologies is a prominent figure in the market as an Oscilloscopes manufacturer and supplier. It has built a big territory of oscilloscopes implementing all the newfangled techniques. These Oscilloscopes are the finest solution for quick analysis, faster debugging and testing of your newest designs. Scientech as an oscilloscope manufacturer has gifted researchers, professors and students with the first-rate model of scope for various test & measurements and laboratory experiments.

  • IP X5, X6 - Walk-In Rain Test Chamber

    ACMAS Technologies Pvt. Ltd.

    WEIBER designs and manufactures standard as well as customized water spray test chamber for evaluating various automotive, electrical and electronics items under water, rain or shower conditions. The chamber interrogates the performance of parts when subjected to water droplets.The system is based on the IP X5, X6 specification requirements, and can also accomplish individual automaker’s tests, as well as electrical-enclosure tests.Our system uses multiple control solenoids to vary the water's spray volume/pressure. A holding tank prepares the water to the desired temperature, if required. A pump ensures the water is delivered in the proper pressure range.

  • Vibration Test Chambers

    Cincinnati Sub-Zero Products

    Our vibration test chambers offer a variety of solutions for vibration testing. AV-Series and CV-Series vibration chambers offer rapid temperature change rates with combined temperature, humidity, and/or vibration environments. These chambers are designed for compatibility with your choice of electrodynamic or mechanical vibration systems. The Benchtop Vibration Table, ideal for vibration testing of small components or electronics and is designed for stand-alone testing or may be placed in an environmental chamber for combined temperature and vibration testing. HALT/HASS Test Chambers provide extreme vibration and temperature capabilities in order to identify design and product weaknesses.

  • PCI-4461, 204.8 kS/s, 118 dB, 3.4 Hz AC/DC Coupled, 2-Input/2-Output Sound and Vibration Device

    779307-01 - NI

    The PCI‑4461 is a high-accuracy data acquisition module specifically designed for sound and vibration applications. It provides simultaneous two-channel dynamic signal generation and simultaneous two-channel dynamic signal acquisition with six gain settings to configure the input range. The PCI‑4461 also includes software-configurable AC/DC coupling and integrated electronic piezoelectric (IEPE) conditioning to ensure precision measurements with microphones, accelerometers, and other transducers that have very large dynamic ranges. Common applications include audio test; automotive test; noise, vibration, and harshness (NVH) analysis; and machine condition monitoring.

  • MTM-IO-Serial: Software Controlled USB Hub and IO Module

    Acroname, Inc

    As part of Acroname's MTM series, the MTM-IO-Serial module is a key component to manufacturing test systems for electronic devices using a standard USB 2.0 interface, serial UARTs and one or more interface voltages. The MTM-IO-Serial module features a software controlled USB hub (USB 2.0 high-speed) with four controllable channels. Each channel has switched data and 500mA current-limited power lines.

  • Automotive Simulation Software

    DYNA4 Framework - TESIS DYNAware Technische Simulation Dynamischer Systeme GmbH

    DYNA4 is a modular simulation software for efficient work with simulation models in the automotive development process, e. g. of electronic control units and components. Model-based design, function development. Testing and pre-calibration in SIL and HIL environments. Fail-safe and functional tests, including evaluation of vehicle response and drivability. Advanced powertrain development and energy management. Fuel efficiency simulation for hybrid (HEV), electric (EV) or traditional vehicles.

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